SOLUTION: A part on an improvement programme at a semiconductor manufacturing facility a patterned wafer inspection system was used based on number of particles. NO PARTICLES

Algebra ->  Probability-and-statistics -> SOLUTION: A part on an improvement programme at a semiconductor manufacturing facility a patterned wafer inspection system was used based on number of particles. NO PARTICLES       Log On


   

Question 856945: A part on an improvement programme at a semiconductor manufacturing facility a patterned wafer inspection system was used based on number of particles.
NO PARTICLES PARTICLES TOTAL
Good 320 14 334
bad 80 36 116
400 50 450
Suppose that a wafer is selected at random.What is the probability that the wafer is
a.is good
b.has no particles
c.is good and has no particles
d.is good or has no particles
e.is good given that it has no particles
f.has no particles,given that its good
Answer by ewatrrr(24785) About Me  (Show Source):
You can put this solution on YOUR website!
 

Hi,

Great! on showing the Sums..will leave reducing Up to You

NO PARTICLES       PARTICLES   TOTAL

Good           320              14         334

 bad            80                36         116

               400                 50          450



Suppose that a wafer is selected at random.What is the probability that the wafer is

a.is good  334/450

b.has no particles  400/450

c.is good and has no particles  320/450

d.is good or has no particles  334/450 + 400/450 - 320/450

e.is good given that it has no particles %28320%2F450%29%2F%28400%2F450%29+=+320%2F400

f.has no particles,given that its good %28320%2F450%29%2F%28334%2F450%29+=+320%2F334